MLK-9637-1 usb: test: define otg_srp_reqd wIndex byte value
authorLi Jun <B47624@freescale.com>
Sat, 27 Sep 2014 11:43:08 +0000 (19:43 +0800)
committerNitin Garg <nitin.garg@nxp.com>
Mon, 19 Mar 2018 19:47:11 +0000 (14:47 -0500)
This patch adds otg_srp_reqd wIndex high byte value for otg test mode.

Acked-by: Peter Chen <peter.chen@freescale.com>
Signed-off-by: Li Jun <b47624@freescale.com>
(cherry picked from commit 34660f7aa14972630622406b9dbfc7a106d8d15d)
(cherry picked from commit c5128f9bafaa37a8e63989032372a5ff36dc82c4)

include/uapi/linux/usb/ch9.h

index 33c603d..dffab2d 100644 (file)
 #define        TEST_SE0_NAK    3
 #define        TEST_PACKET     4
 #define        TEST_FORCE_EN   5
+#define        TEST_OTG_SRP_REQD       6
 
 /*
  * New Feature Selectors as added by USB 3.0