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(parent: f6e8746) | patch
MLK-16013-20 usb: typec: Add bist test mode support
authorLi Jun <jun.li@nxp.com>
Wed, 9 Jan 2019 05:57:08 +0000 (11:27 +0530)
committerLeonard Crestez <leonard.crestez@nxp.com>
Wed, 17 Apr 2019 23:51:34 +0000 (02:51 +0300)
commit7e2610833201558d818dc976c606c87ce791071a
treea3a86a03664f29d0779b4900e07447c777a4c66etree
parentf6e8746de37f3c01043d6a0e90543da9386df6abcommit | diff
MLK-16013-20 usb: typec: Add bist test mode support

BIST(Built In Self-Test – Power Delivery testing mechanism for
the PHY Layer), see PD 3.0 spec 5.9 Built in Self-Test (BIST), is
added to support BIST message handling in PD compliance test.

Reviewed-by: Peter Chen <peter.chen@nxp.com>
Signed-off-by: Li Jun <jun.li@nxp.com>
Signed-off-by: Vipul Kumar <vipul_kumar@mentor.com>
drivers/usb/typec/tcpci.c diff | blob | history
drivers/usb/typec/tcpci.h diff | blob | history
drivers/usb/typec/tcpm.c diff | blob | history
include/linux/usb/tcpm.h diff | blob | history